ellipsometry是什么意思   ellipsometry怎么读

ellipsometry单词基本解析：

ellipsometry变化用词：

ellipsometry英英释义：

ellipsometry中文词源：

ellipsometry用法和例句：

ellipsometry

Spectroscopic ellipsometry indicates that the quantum effect of ZnO quantum dot leads to the fact that the absorption energy of exciton(3.76 eV) is bigger than the band gap of bulk ZnO.

SE表征发现ZnO量子点的量子效应导致了ZnO量子点的激子吸收能(3.76eV)比ZnO体晶的能带隙(3.37eV)大。

Polymer Thin Film Growth on Si Substrate ( Ellipsometry )

Si衬底上聚合物薄膜生长(椭圆偏振仪)

To this end, we have performed in situ ellipsometry measurements while etching through homogeneous, comparatively thick SiGe films of a known Ge content.

为此，我们实施了对于刻蚀均匀的比较厚的已知锗浓度的锗硅薄膜的同步椭偏测量。

SCI offers diverse tools for optical thin film design, material analysis, ellipsometry, and spectrophotometry.

为薄膜设计,材料分析,椭圆偏光法,分光光度测定法提供不同的工具。最近的光学薄膜软件包括:一。

imaging ellipsometry

光学椭偏成像技术

Keywords spectroscopic ellipsometry;anisotropy;refractive index;phase retardation;

光谱型椭偏仪;各向异性;折射率;相位延迟;

spectroscopic ellipsometry

光谱椭圆对称

Keywords spectroscopic ellipsometry;Nickel;Cobalt;Ion implantation;

光谱椭圆法;镍;钴;离子注入;

Spectroscopic ellipsometry study of the chemical bonds of carbon films

功能碳薄膜化学键成分的椭偏光谱研究

Research on dynamic reflecting spectroscopic ellipsometry and its application in the measurement of thin films

动态椭偏光谱技术及其在薄膜测量中应用的研究

dynamic spectroscopic ellipsometry

动态椭偏术

Packaging: Barrier Coating for Food Plastic Films, Bottles ( Ellipsometry )

包装:食物包装用塑料膜、瓶子的保护涂层(椭圆偏振仪)

Compared with traditional ellipsometer, imaging ellipsometry shows an advantage of distinguishing both affinty and non-specific binding in different area on the surfaces.

另外，它还弥补了传统的椭偏法的不足之处，能够有效地区分非特异性吸附、脱吸附或表面污染带来的干扰。

Variable angle spectroscopic ellipsometry(VASE)is a instrument for measuring optical film refractive index and thickness and is a powerful technique for research on new materials and processes.

可变角度的光谱椭偏仪(VASE)是一种测量光学薄膜折射率和厚度的仪器，它对于新材料和新过程的研究是一种强有力的技术手段。

Spectroscopic Ellipsometry Theory of Anisotropic Thin Films

各向异性择优取向薄膜的椭偏光谱术理论

Automatic Ellipsometry Measurement Instrument for Anisotropic Materials

各向异性材料光学常数全自动椭偏测仪

Study on Influences of Tween 20 on Property of Zinc Electrode with Graze Ellipsometry

吐温20对锌电极性能影响的掠射椭偏法研究

Variable angle spectroscopic ellipsometry (VASE) is important for metrology in several industries, and is a powerful technique for research on new materials and processes.

在很多种工业上，可变角度椭偏仪对于形态学是很重要的，而且对于研究新材料和新制程更是一个强而有力的技术。

In order to monitor multiple protein reaction processes simultaneously,a biosensor based on imaging ellipsometry operated in the total internal reflection mode was proposed.

基于全内反射椭偏光学成像系统,提出了一种实时光学蛋白质芯片生物传感器,用于同时检测多种蛋白质分子的动态相互作用过程。

Study on Heterodyne Ellipsometry and Error Analysis of Frequency Mixing

外差椭偏测量技术及其混频误差分析

The analysis to optical constant and film thickness also show that the ellipsometry is effective for multi-layer thin films analysis.

对多层膜厚度和光学常数的分析表明，椭偏法仍然是一种行之有效的薄膜光学常数测量方法。

The measuring condition for principle angle in spectroscopic ellipsometry is analyzed.

对椭圆偏振光谱中的主角测量条件进行了分析。

According to comparing with simulation annealing algorithm the paper introduce very fast simulation annealing algorithm and use VFSA to compute the ellipsometry data.

对比模拟退火算法介绍了非常快速模拟退火算法的流程,并使用非常模拟退火算法计算了椭偏数据。

Methods for determination oil volume on tin plate surface were reviewed,which include gravimetry, hydrophil balance method, molecular spectrometry and ellipsometry etc.

对测定镀锡板表面涂油量的测定方法进行了综述,这些方法包括重量法、亲水天平法、分子光谱法和椭圆偏振法等。

interferometric ellipsometry

干涉椭偏术

Electrochemical performance of zinc-plated foam nickel electrode in alkaline solution (KOH) was stu-died by grazing ellipsometry and cyclic voltammetry.

应用掠射式椭圆偏振技术 (掠射椭偏术 )和循环伏安法对以泡沫镍为基体的表面镀锌电极在碱性电解质 (KOH)中的电化学行为进行了研究。

Influence of Metal-Coated Mirrors on Measurement Accuracy in Heterodyne Interferometric Ellipsometry[J].

引用该论文 Deng Yuanlong,Li Yuezhi,Wu Yubin,Xu Gang.

Ellipsometry study on the non-mirr or surface films[J].

引用该论文 张淑芝,王志刚,李淑英.

Ellipsometry Techniques in Poled Polymer Electrooptic Coefficients Measurements[J].

引用该论文 徐建东,杨昆,刘树田,李淳飞.

Improving ellipsometry precision by correctly using multi-times measurement[J].

引用该论文 王芳宁,王植恒,刘细成,刘洋.

GaN epilayer by infrared spectroscopic ellipsometry[J].

引用该论文 王静,李向阳,刘骥,黄志明.

Analysis of Measuring Condition for Principle Angle in Spectroscopic Ellipsometry[J].

引用该论文 赵海斌,夏国强,陈岳立,李晶,周仕明,陈良尧.

Results also show that mieroelectrode technique and ellipsometry can be applied to in-situ measurement of the process in crevice corrosion of stainless steels.

微电极测试技术和椭圆偏振法可应用于不锈钢缝隙腐蚀过程的原位测试。

In addition, we use the Senarmont Ellipsometry to measure the optical retardation of liquid crystal cell.

我们亦将萨纳曼特椭圆仪应用在量测液晶盒的相位延迟中。

Graze ellipsometry spectrum

掠射式椭圆偏振光谱

Graze ellipsometry spectrum; Tween 20; Zinc electrode; Electrolytic solution; Additive;

掠射式椭圆偏振光谱;吐温20;锌电极;电解液;添加剂;

Craze ellipsometry

掠射式椭圆偏振技术

Keywords Graze ellipsometry;Electrode surface;Diffusion layer;

掠射式椭圆偏振方法;电极表面;扩散层;

Keywords Graze ellipsometry;spectrum analysis;potassium ferrocyanide;

掠射式椭圆法;谱学分析;亚铁氰化钾;

Keywords Graze ellipsometry;Ele ctrochemi cal reaction;Diffusion layer;Phase retarding;Amplitude absorbing;

掠射椭圆偏振技术;电化学反应;扩散层;相位延迟;振幅吸收;

Study on Mathamatical and Physical Model of Graze Ellipsometry

掠射椭圆偏振谱学方法数理模型的研究

A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced.

探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性。

Feasibility of measuring complex refractive index with ellipsometry is discussed and a set of experiment equipment is set up to make elementary experiment.

探讨了椭圆偏振测量术应用生物组织复折射率测量的可行性，建立了相应的实验装置并进行了初步的实验测量。

Abstract： Ellipsometry of light scattering from optical thin films are investigated based on reflection ellipsometry measurements from optical thin films.

摘 要： 基于光学薄膜反射椭偏法的测量原理，对光学薄膜散射椭偏特性进行了研究。

Abstract : The effects of different silica surfaces and different bulk solutions on the adsorption of BSA at the solid/liquid interface were systematically studied by in situ ellipsometry.

摘要 ： 用原位椭圆偏振术系统研究了硅片表面因素及缓冲液环境因素对牛血清清蛋白在固/液界面吸附的影响。

A protein microarray biosensor based on imaging ellipsometry has been developed as a high-throughput and fast technique for protein analysis.

摘要椭偏光学生物传感器是识别和检测蛋白质的一种新型的高通量、快速生物分子分析技术。

Fundamentals of ellipsometry and automatic ellipsometers are introduced briefly, and a sample machine of new type automatic null ellipsometer has been designed and constructed.

摘要简要介绍了椭圆偏振测量术的基本原理及自动椭偏仪，并设计制作了一台新型自动消光椭偏仪的原理样机。

About one century history of novel spectroscopic ellipsometry(SE) is reviewed.Its classification,applications and new developments are introduced and described in detail.

本文回顾了独具特色的椭偏光谱学近一个世纪的历史发展，综述了椭偏光谱学的应用现状，指出了其前沿研究领域，并对这一古老而又年轻的光谱学分支作了展望。

Spectroscopic ellipsometry(SE) is introduced and described systematically on basic principle and developments.A new optimum method - simulated annealing algorithm is applied in the inversion of SE.

本论文系统介绍了椭圆偏振光谱的基本原理，将模拟退火方法这一新颖的优化过程引入到椭圆偏振光谱的分析中。

Reference [1]Azzam R.M. Am, and N.M. Bashara, ”Ellipsometry and polarized light”, North-Holland publishing Company, Netherlands,(1977

李正中,薄膜光学与镀膜技术第四版,艺轩图书出版社,台北,385-396(2004

R. M. A. Azzam, N. M. Bashara, ELLIPSOMETRY AND POLARIZED LIGHT, p340-363, North-Holland, New York

李正中，薄膜光学与镀膜技术，第四版，艺轩出版社，第十章、第十一章(2004)。

The extracted results are in good agreement with the results measured by ellipsometry.

栅介质厚度模拟结果和椭偏仪所测实验结果吻合良好。

imagine ellipsometry

椭偏光学成像技术

Keywords Imaging ellipsometry;Silicon bio-chip;Anti-IgG;

椭偏光成像;蛋白芯片;免疫球蛋白G抗体;

Ellipsometry imaging

椭偏光生物显微成像技术

Ellipsometry design and data analysis of the monitoring system of thin wire on-line measuring

椭偏法细丝在线监测系统设计及数据分析

Keywords ellipsometry;heterodyne interferometer;nonlinearity error;film measurement;acoustooptic modulator;

椭偏测量术;外差干涉;非线性误差;薄膜测量;声光调制器;

A User's Guide To Ellipsometry

椭偏测量术用户指南

Keywords Ellipsometric spectroscopy;Ellipsometry;Stripping ellipsometry;Optical tracking rate;

椭圆偏振光谱;椭圆法;溶出椭圆法;光学参量变化速率;

Keywords Spectroscopic Ellipsometry（SE）;Amorphous Polymer;Refractive Index Spectrum Chromatic Dispersion.;

椭圆偏振光谱;非晶态高聚物;折射率谱;光学色散;

As a non-destructive and a non-contacting tool to characterize the optical properties of the photonics materials, spectroscopic ellipsometry has been widely used in industry and academic research.

椭圆偏振光谱测量是一种非接触、非破坏的测量方法，已经被广泛应用到光电子材料工艺和科学研究中。

Azimuth, in Ellipsometry - The angle measured between the plane of incidence and the major axis of the ellipse.

椭圆方位角-测量入射面和主晶轴之间的角度。

ellipsometry method

椭圆计法

Paints quality, Plastics, Polymer, Optical Brighteners and Phosphor Coatings ( Ellipsometry )

油漆质量,塑料,聚合物,荧光增白剂和磷涂层(椭圆偏振仪)

Keywords sol-gel process;spectroscopic ellipsometry;optical constants;microstructure;

溶胶-凝胶工艺;椭圆偏振光谱仪;光学常数;微结构;

The Determination of Thickness and Refractive Index of Magnetic Garnet Films by Multiple Angle Laser Ellipsometry

激光椭偏仪多角入射法测定磁性石榴石薄膜的厚度和折射率

Study of the Ultrathin Oxide Layer on Silicon by AES and Ellipsometry

用AES及椭偏仪研究硅上超薄氧化层

The experimental results show that the ellipsometry with a new parameter VOP could be analyzed qualitatively for the electrochemical systems effectively.

用新物理量Vop的椭圆法定性地分析电化学体系已十分有效.

The inhibition of molybdate for corrosion of carbon steel in cooling water is studied by means of ellipsometry.

用椭圆法通过测定表面膜层厚度,折射系数和表面复盖度研究了钼酸盐对碳钢在工业冷却水中的缓蚀作用。

Study on Aniline Electrochemical Polymerization with Potential Scanning Ellipsometry

电位扫描椭圆法对苯胺电聚合的研究

Keywords electrochemical reactions;diffusion layer / graze ellipsometry;

电化学反应;扩散层／掠射式椭圆偏振技术;

Direct Calculation Method of Measuring the Reflective Index and the Thickness of the Rough-Surface Films by Ellipsometry

直接计算法计算粗糙面薄膜的折射率和厚度

in this paper, an ellipsometry technique for measuring poled polymer electrooptic coefficients is studied.

研究了利用椭偏技术进行极化聚合物电光系数测量的方法。

The feasibility of using protein A to immobilize antibody on the silicon surface of the imaging ellipsometry biosensor was investigated in this study.

研究了在硅片表面上通过A蛋白定向固定抗体分子用于椭偏光学生物传感器免疫检测的可能性。

Keywords carbon film;spectroscopic ellipsometry;chemical bond;

碳薄膜;椭偏光谱;化学键;

Infrared spectroscopic ellipsometry(IRSE)

红外椭偏光谱

infrared spectroscopic ellipsometry

红外椭圆偏振光谱

Study of heterodyne ellipsometry for nanometer film measurement

纳米厚度薄膜外差椭偏测量技术的研究

Optical heterodyne interferometry together with reflective ellipsometry,a fast measurement technology with high anti-interference performance was applied to nanometer film.

结合激光外差干涉术和反射式椭偏测量技术,设计了一种抗干扰能力强,快速、高精度测量纳米厚度薄膜光学参数的方法。

Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.

结合激光外差干涉法和透射式椭偏测量原理,研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。