ellipsometer是什么意思   ellipsometer怎么读

ellipsometer单词基本解析：

ellipsometer变化用词：

ellipsometer英英释义：

ellipsometer中文词源：

ellipsometer用法和例句：

ellipsometer

This can afford the theoretical and experimental proof for adjusting ellipsometer rapidly.

为迅速调整好椭偏仪提供了理论和实验依据。

Ellipsometer is widely used in the field of studying the thickness, refracive index, extinction coefficient of the multilayer film and some optical properties of graded layer are also given.

主要研究变角度变波长椭圆偏振仪测量多层膜每层膜厚和光学特性,并给出了光学梯度薄膜的梯度特性。

A new type of infrared spectroscopic ellipsometer has been designed and constructed.A double-Fourier-transform method, i.e.

介绍一种新型红外椭圆偏振光谱实验系统。

FE-SEM, AFM and Spectroscopic Ellipsometer are used to characterize the surface microstructure and optical properties of the film.

使用反射式扫描椭偏仪、扫描电子显微镜（SEM）、原子力显微镜（AFM）测试了薄膜的光学性能和微观形貌。

SEM,AFM,IR and ellipsometer were used to characterize the structure and optical properties of the films.Mechanical property of films was measured by pencil hardness-testing device.

使用扫描电镜(SEM)、原子力显微镜(AFM)、椭偏仪、铅笔硬度仪等测量和分析薄膜的特性。

Opto-BioMorphin;OBMorph;biochip;ellipsometer;Surface Plasmon Resonance;Waveguide Interferometry

光生化检测仪;生医晶片;椭偏仪;表面电浆共振仪;波导干涉仪

Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer

光谱型椭偏仪对各向异性液晶层的测量

spectroscopic ellipsometer

光谱椭偏仪

Compared with traditional ellipsometer, imaging ellipsometry shows an advantage of distinguishing both affinty and non-specific binding in different area on the surfaces.

另外，它还弥补了传统的椭偏法的不足之处，能够有效地区分非特异性吸附、脱吸附或表面污染带来的干扰。

Nonlinear Error Introduced by Beam Splitters in an Interferometric Ellipsometer[J].

引用该论文 Deng Yuanlong,Li Xuejin,Chai Jinlong,Xu Gang.

New Design of Angle-Variable Spectroscopic Ellipsometer (RPA type)[J].

引用该论文 冯星伟,苏毅,马宏舟,陈良尧,钱佑华.

Data Processing and Error Correcting of Ellipsometer[J].

引用该论文 陈云锋,陈炳若.

In this paper, we study the detecting methods for testing the biochip by using the theory of ellipsometer.

摘要介绍了利用椭圆偏振测量仪原理测试生物芯片的检测方法。

Fundamentals of ellipsometry and automatic ellipsometers are introduced briefly, and a sample machine of new type automatic null ellipsometer has been designed and constructed.

摘要简要介绍了椭圆偏振测量术的基本原理及自动椭偏仪，并设计制作了一台新型自动消光椭偏仪的原理样机。

Keywords Crystal film;Photon tunneling image;Ellipsometer;

晶体薄膜;光子隧道像;椭圆偏振术;

Spectral Ellipsometer Data Processing and Analyzing for Homosphere Film Measurement

椭偏光谱测量匀质膜光学特性的计算分析

ellipsometer test

椭圆偏振仪

Then the numerical algorithm which is used to interpret the direct results of the ellipsometer in terms of optical parameters is described.

然后描述用于解释由椭偏仪直接得到的光学参数的算法。

The thicknesses of the thin films are measured by spectroscopic ellipsometer.

用光谱式椭偏仪对薄膜的厚度进行了测试。

FTIR,XRD and AFM are used to characterize the films.The refractive index and dielectric constant are measured by Ellipsometer and impedance analysis apparatus.

用红外光谱、小角XRD、原子力显微镜对样品进行了表征,并采用椭偏仪和阻抗分析仪测量薄膜的折射率和介电常数。

From the computer simulation of ellipsomerry, we found that the sensitivity of ellipsometer is enhanced when the angle of incidence is set to close the Brewster angle of the air/substrate system.

由椭圆偏振的计算机模拟计算得知,当所设入射角接近所甩空气/基底体系的Brewster角时,椭圆偏振仪的灵敏度最高;

Some well-known methods for optical constants measuring include ellipsometer method, transmission spectrum method and so on.

目前，测量薄膜光学特性的方法有偏振测量法、透射光谱分析法等。

A heterodyne interferometric ellipsometer (IE) with two acousto-optical modulators was investigated.A single layer of transparent ITO on a glass substrate was measured;

研究了一种采用声光调制器实现的透射式外差干涉椭偏(IE)测量系统。

The magnetooptic self-nulled ellipsometer,with ac Farady magnetooptic modulating and phase locking to detect nulled point,has the high abilities of prevent interference and angular recognize.

磁光调制锁相椭偏仪采用交流法拉第磁光调制及相敏检波来检测消光点,具有抗干扰能力强,角分辨能力高等优点。

Thickness measurement of transparent optoelectronic films with combination of spectrometer and ellipsometer

紫外可见吸收光谱仪与椭偏测厚仪联用测量透明光电子薄膜的厚度

The successfully developed of this ellipsometer greatly stimulates our country's magnetooptic disk qualities.

而且该椭偏仪的研制成功对国产磁光盘质量提高具有极大的促进作用。

The ultraviolet-induced refractive index changes, measured by prism coupler and spectroscopic ellipsometer, are dependent on the number of laser shots and the pulse repetition rate.

藉由调整雷射照射发数与光罩宽度，我们可以得到不同长宽比的光场场型。

A new type of spectroscopic ellipsometer with polarizer and analyzer rotating synchronnously at a speed ratio of 1: 2, has been designed and constructed.

设计制作了一台用同步旋转起偏器和检偏器(转速之比为1:2)测量方式的波长扫描型椭偏仪。

Using AZ4620 photoresist throw at plane glass, the measuring thickness of photoresist is benchmark through ellipsometer.

采用AZ4620正型光刻胶甩胶于平面玻璃基片，以椭偏仪测量的结果为基准。

The properties of the coatings were characterized by ellipsometer, UV-vis spectrophotometry, FTIR-spectroscopy, scanning probe microscope and contact angle measurement apparatus.

采用椭偏仪、分光光度计、红外光谱、扫描探针显微镜、静滴接触角测量仪表征薄膜的特性。